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Tag Archives: metrology

T-Solar Adopts BrightView’s Metrology Solution

BrightView Systems, a leading provider of in-line metrology-basedprocess control and optimization tools for thin-film solar cellmanufacturing received technical acceptance and announces deployment ofits InSight-M at T-Solar’s thin film solar factory at Ourence, Spain. The tool will be utilized for capturing and analyzing process maps for 100percent of the produced panels, a method that will dramatically [...]

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BrightView Systems Integrates Metrology System At Signet Solar

BrightView Systems, a Petach-Tikva, Israel-based provider ofmarket-process and production-optimization technologies for thin-filmphotovoltaics, has completedthe integration and validation of its Wide Area Metrology (WAM) processmetrology and mapping solution for Signet Solar’s production line inMochau, Germany. The WAM tool, developed by start-up BrightViewSystems, features in-line, true-cell-metrology and measurementcapabilities and an associated suite of control applications forexcursion detection, [...]

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Nanometrics Unveils New Metrology System For Solar PV Applications

Nanometrics Inc., a supplier of process-control metrology systems, has launched the TSM integrated metrology system. Thelatest in Nanometrics’ Trajectory product line, the TSM is designed torapidly measure the thickness of various thin films in order to enablefast feedback and excursion prevention in the manufacture of all typesof solar photovoltaic cells. The product further expands Nanometrics’metrology [...]

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